Title: "Probing complex materials one atom at a time by a combination of theory and microscopy"
Abstract: Calculations based on density functional theory using high-performance computers have made enormous strides in describing the atomic-scale properties of complex materials. In parallel, aberration-corrected scanning transmission electron microscopy has reached extraordinary levels of spatial and energy resolution, in both imaging and electron-energy-loss spectroscopy. The combination of theory and microscopy provides an unparalleled probe to unravel the atomic-scale processes that control vital properties for electronic, optoelectronic, and energy-related applications. You are invited to a journey through the wide world of complex materials structures – semiconductors, superconductors, complex oxides, graphene, ultrasmall nanoparticles – for a first-hand experience of the nanoscale.
Research supported by DOE Basic Energy Sciences; primary collaborator: Steve Pennycook (formerly at ORNL).
Speaker Bio: Sokrates Pantelides, Department of Physics and Astronomy and Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, and Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN.