Atomic force microscopy is a type of scanning probe microscopy with resolution on the order of fractions of a nanometer and is widely used to collect data on various mechanical, functional, and electrical properties. As a powerful imaging and measurement technique, its use in nanoscale research and industrial R&D is critical. The relationship between an AFM cantilever and its application mode is crucial in determining the success of an AFM measurement. Although a very versatile and reliable instrument, the forces acting at the tip of the cantilever are still not quantifiable. Determining such forces will not only make the AFM a more quantitative instrument but will also allow the distinguishment of true signals from spurious ones. With the use of finite element analysis, we are creating a model that can quickly and efficiently simulate the dynamic behavior of an AFM cantilever under realistic conditions - giving us a tool to fit real data to extract more directly the forces acting at the tip and along the cantilever. This work will allow people to use AFM to directly determine mechanical properties of materials at the nanoscale as well as electromechanical properties and be used as a tool to train neural nets and similar tools.

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https://umich.zoom.us/j/94634729083

Meeting ID: 946 3472 9083
Passcode: 902665 Speaker(s): Alexis Flores-Betancourt (Oak Ridge National Laboratory)